Electrical breakdown of a dielectric for the formation of a superconducting nanocontact

Electrical breakdown of the dielectric nanolayer between film electrodes niobium and an alloy 50% indium tin forms a bridge this electrodes. The resistance depends on current. length is equal to thickness (30 nm), its diameter 25 nm. calculated coherence at 0 K close bridge. critical current with 1 {\Omega} temperature 2 mA. It concluded that such should have properties Josephson contact lower than (6.5 K).